Dimension Atomic Force Microscope


The Dimension 3100 AFM in the CMI handles a wide range of sample types including polymers, biological samples and semi-conducting materials. 

Things to consider before using this instrument:           

  • Maximum single scan area  is 111 X 111 m.         

  • Maximum sample z range (i.e. maximum allowable distance from highest to lowest part of sample surface) is 5 m.        

  •  Maximum sample area, several square inches (but see maximum single scan area).        

  • Maximum sample thickness c. 1/2 inch (surfaces must be parallel).

  • Resolution 1-10 nm.

Location : Lab 116 Orbsen Building

Contact : Dr Eadaoin Timmins for Booking